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An MFC-based multi-threaded test environment for the validation of an embedded automotive microcontroller

Amir A Khwaja, Intel Corporation, USA

Embedded microcontrollers are used in a multitude of commercial applications such as modems, motor-control systems, air conditioner control systems, automotive engine and antilock braking systems among others. The high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such high-speed event-based applications. However, these critical application domains also require that these microcontrollers are highly reliable. The high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the component and at the system level. Intel â´s Chandler Platform Engineering department developed an object-oriented multi-threaded test environment for the validation of its 8XC196EA automotive microcontrollers. The goals of this environment was not only to provide a robust testing environment for the 8XC196EA automotive microcontrollers, but to develop an environment which can be easily extended and reused for the validation of several other future embedded microcontrollers. The environment was developed in conjunction with Microsoft â Foundation Classes (MFC). The paper describes the design and mechanism of this test environment, its interactions with various hardware/software environmental components, and the pros and cons of using MFC.'