| Mehmet Aksit | University of Twente, Netherlands |
| François Bançilhon | Ardent Software, USA |
| Richard Bielak | CAL FP (US), Inc., USA |
| Gilad Bracha | Sun Microsystems, USA |
| Eduardo Casais | Nokia, Finland |
| Franco Civello | Cap Gemini, UK |
| Dominique Colnet | LORIA-INRIA Lorraine, France |
| Bernard Coulange | Verilog, France |
| Paul Dubois | Lawrence Livermore National Laboratory, USA |
| Jon Durrant | Parallax Solutions Ltd, UK |
| Jean-Marc Geib | University de Lille, France |
| Yossi Gil | Technion, Israel; and IBM Research, USA |
| Petter Graff | InferData, USA |
| Ian Graham | Chase Manhattan Bank, UK |
| Rachid Guerraoui | Swiss Federal Institute of Technology, Switzerland |
| Brian Henderson-Sellers | University of Technology, Sydney, Australia |
| Laura Hill | Sun Microsystems, USA |
| René Jacquart | CERT, France |
| Jean-Marc Jézéquel | IRISA-INRIA, France |
| Sven-Eric Lautemann | University of Frankfurt, Germany |
| Michel Lemoine | ONERA-CERT, France |
| Ian Maung | Platinum Technology, USA |
| Jim McKim | Rensselaer at Hartford, USA |
| Mira Mezini | University of Siegen, Germany |
| Christine Mingins | Monash University, Australia |
| Frieder Monninger | Object Tools, Germany |
| Meilir Page-Jones | Wayland Systems, USA |
| Jean-Claude Royer | University of Nantes, France |
| Ted Velkoff | Lockheed Martin, USA |
| Kim Waldén | ENEA, Sweden |
| Tony Wasserman | Software Methods and Tools, USA |
| Wolf Zimmermann | University of Karlsruhe, Germany |